HATINA GP
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Equipment
The HATINA GP is designed for testing complex Smart Power ICs and SoCs. Recommended for high parallelism.
HATINA GP is the ATE system designed to meet the characterization needs of analog and mixed-signal devices for production testing.
Thanks to a modular mainframe with up to 10 slots, it integrates multiple instruments into a single, flexible, and scalable platform, adaptable to any type of requirement.
Control is managed through an intuitive graphical software interface that requires no programming skills, making it ideal for both Designers and Test Engineers (TE).
Reasons Why
Product Presentation
HATINA GP is a general-purpose ATE system developed by Cosmic for high-parallelism testing of ASICs, PMICs, and Smart Power ICs/SoCs.
Designed for both wafer-level and packaged device applications, the system integrates modular resources for DC testing, digital signals, and complex measurements. Its intelligent resource management maximizes efficiency and reduces test costs.Thanks to built-in multiplexers, HATINA GP simplifies load board design, enhancing reliability and minimizing footprint. The architecture supports up to 10 slots.
HATINA GP
Dimensions
Analog/Power
DCS LP: 160 channels, - 80V / +110V @ ± 200mA
DCS MP: 80 channels, - 80V / +110V @± 4A
Digital
256 CH per board, PPMU, active load
64M Pattern Memory per pin (up to 128M)
64 M vectors DSIO / HRAM memory depth per pin
Measurements Instruments
16 channels 80MSPS Digitizer, TMS
16 Differential Voltage Meter
Kronos is a Software Toolset which generates better and faster Test Programs, through automatic translation of test descriptions to code.
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