Hatina WLBI

The Hatina WLBI by Cosmic is a robust wafer-level Burn-In and HTOL (High-Temperature Operating Life) solution designed specifically for power devices on wafers. This compact tester chamber (560×560×550 mm) plugs into standard wafer probers, enabling full-wafer Burn-In without major equipment overhauls.
Its high parallel throughput supports up to 1600 test sites simultaneously, each operating at up to 1.2 kV and 2 mA – ideal for lifecycle and reliability testing of power technologies.
The WLBI seamlessly integrates functional burn-in, HTGB (High-Temperature Gate Bias), and HTRB (High-Temperature Reverse Bias) test setups, offering a flexible and cost-effective package.
Compact and easy to handle, the WLBI is engineered for cleanroom use.
This design reduces energy use, lowers footprint, and simplifies automation compatibility.
In summary, the Hatina WLBI is a high-density, wafer-level Burn-In platform that delivers full-wafer reliability testing for advanced power semiconductors, combining high voltage, tight temperature control, and multi-site scalability in a compact, integration-friendly format – perfect for enhancing manufacturing efficiency and device confidence.