M2 DS6 Pulsar
Dynamic Switch Test Generator
Test Wide Bandgap Devices such as SiC MOSFETs, JFETs, half-bridges and diodes to automotive quality standards such as AEC-Q101 and AQG 324. DS6 Pulsar performs dynamic switch tests at high currents up to 7,500A at KGD, discrete and module stages of manufacture. DS6 Pulsar’s ultra fast switching speeds recreate high current stress conditions that devices will experience during automotive operation.
A hard dock handler interface ensures fast slew rates, critically damped waveforms and stray test inductance of typically 20-40 nH. SocketSafeTM technology protects the test cell should a device catastrophically fail during test, perfect for wide bandgap power technologies so you can ship highest quality, conforming product.
Performance – Pushing Test Limits
Short Circuit testing up to 7,500 A, specifically engineered for automotive applications, simulating real-life stress events such as shoot-through. Hard dock interfacing allows the device under test to be plugged in closer to the test station, minimizing parasitic inductance. 20-40 nH typical parasitic inductance for ultra fast switching speeds with minimal overshoot. This significantly improves test ramp times without the risk of voltage overshoot exceeding the device’s limits.
20nH Typical stray inductance
Testing Flexibility
Cost effective and efficient, invest in DS6 Pulsar to perform a wide range of tests on one hardware platform. Easily redeploy to other handlers and DUT types by just changing the interface daughterboard.
These custom-made daughter boards are easily interchangeable and integrate with DS6 Pulsar’s hardware, allowing seamless integration and perform all tests on a single platform.
DUT is switched ON, charging up inductor
DUT is switched OFF, freewheeling the current through AUX body diode
DUT is switched ON again, recharging the inductor
WHY: Allows precise measurement of switching parameters: tr, tf, Ton, Toff, Eon, Eoff
Switching speed and efficiency
Exactly like DSIND but with the AUX switching instead of the DUT
AUX is switched ON, charging up inductor
AUX device is switched OFF, freewheeling the current through the DUT’s body diode
AUX device is switched ON again, recharging the inductor
WHY: Allows precise measurement of body diode parameters:: Irr, trr, Qrr
Switching losses and efficiency (due to body diode)
AUX is switched ON
DUT is switched ON, allowing high current to flow through
DUT switches OFF after a few microseconds
WHY: Simulates real-life scenarios the device will operate at: Isc Thermal Runaway Shoot-Through
Device ruggedness, enforcing zero-defect policy
Tester Cabinet
Houses Linux test controller and power supplies for DS6 Pulsar and other test generators.
Test Generator
Powered by the tester cabinet, this includes control, auxiliary and power interface boards which orchestrate tests and communicate back with the host PC.
Waveform Capture
High bandwidth oscilloscope captures waveforms from the differential probes and Rogowski coils.
Applications Adapter
This includes 2 x differential probes for measuring Vds at DUT, gs at the DUT, and two Rogowski current measuring probes for measuring current at the drain of the DUT (one for scope, one for SocketSafe™ protection).
1
Daughterboard
Handler and package specific daughterboards
provide a high performance, low inductance interface to the test socket.
2
Gate Drive Module
Located close to DUT which allows different gate drivers to be switched in depending on DUT.
Overcurrent protection
Protect your Investment with SocketSafeTM technology that safeguards the contactor and test generator should the device under test develop a fault. Energy is swiftly removed from the device and tester, minimizing the need for contactor repairs, saving on maintenance costs and maximising uptime and UPH.
